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[Ataitec] Ataitec 新品發布 - introduces In Situ De-Embedding (ISD)

If you ever need to do TRL calibration, you will find AtaiTec’s patent-pending In Situ De-embedding (ISD) technique most useful. Compared to more than seven test coupons on a TRL calibration board, ISD needs only one through trace. TRL requires that the calibration board and DUT test fixture have identical characteristic impedance, which is an impossible feat to achieve. In addition, TRL does not remove coupling among lead-in traces. The result is that the S parameters of DUT after TRL calibration are almost always non-causal and are difficult to correlate with simulation. ISD addresses all of these issues with a very simple procedure: (a) measure the through trace test coupon (which only needs to have similar, but not identical, behavior as the DUT test fixture); (b) measure DUT + test fixture; and (c) run ISD software.

If you are interested for this Software solution, please feel free to contact us.